New standard allows stacked dies in 3D integrated circuits to connect with test equipment

27/01/2020
3D integration

An imec-initiated industry collaboration leads to publication of IEEE Std 1838TM for test access architectures for 3D integrated circuits (3D-ICs)

Close-up of a semiconductor wafer with repeated chip patterns in green, gray and orange
Diagram of test equipment connected to a 3D IC with three stacked dies and test access paths through each die.

About imec

Imec is a world-leading research and innovation hub in nanoelectronics and digital technologies. The combination of our widely acclaimed leadership in microchip technology and profound software and ICT expertise is what makes us unique. By leveraging our world-class infrastructure and local and global ecosystem of partners across a multitude of industries, we create groundbreaking innovation in application domains such as healthcare, smart cities and mobility, logistics and manufacturing, energy, and education.

As a trusted partner for companies, start-ups, and universities we bring together more than 4,000 brilliant minds from over 97 nationalities. Imec is headquartered in Leuven, Belgium and has distributed R&D groups at a number of Flemish universities, in the Netherlands, Taiwan, USA, and offices in China, India and Japan. In 2018, imec's revenue (P&L) totaled 583 million euro. Further information on imec can be found at www.imec-int.com.

Imec is a registered trademark for the activities of IMEC International (a legal entity set up under Belgian law as a "stichting van openbaar nut”), imec Belgium (IMEC vzw, supported by the Government of Flanders), imec the Netherlands (Stichting IMEC Nederland, part of Holst Centre which is supported by the Dutch Government), imec Taiwan (IMEC Taiwan Co.), imec China (IMEC Microelectronics (Shanghai) Co. Ltd.), imec India (Imec India Private Limited), and imec Florida (IMEC USA nanoelectronics design center).

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