Jeroen De Coster
Jeroen De Coster holds a master’s degree in Electrical Power Engineering (2001) and a PhD in Electrical Engineering (2006), both from KU Leuven. De Coster’s PhD work focused on the design, modelling and characterisation of RF-MEMS devices. Since 2006 he has worked for imec in Leuven, where he is developing measurement tools and procedures for functional characterization, as well as yield and reliability testing of MEMS, silicon photonics, and memory devices.

Authored articles

Developing silicon photonics technologies with a wafer-level test station
Imec and FormFactor present a unique wafer-level test solution that enables semi-automatic testing of passive and active silicon photonics components and circuits.
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