Shih-Hung Chen
Shih-Hung Chen (Masters 2002; PhD 2009) has been with the Device Reliability and Electric Characterization (DRE) Group at imec since 2010, and as ESD team lead and principal member of technical staff (PMTS) since 2019. He authored or co-authored more than 100 conference and journal publications. His current research interests include ESD protections in advanced sub-5nm technology nodes, in 3D/2.5D IC applications, and in Design Technology Co-Optimization (DTCO), System Technology Co-Optimization (STCO) with the integrations of III-V compounds.
Authored articles
How to protect advanced CMOS technologies with thin Si substrates against ESD events
Imec exploits the chip’s functional backside to develop high-performance ESD protection devices
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