Jacopo Franco

Jacopo Franco is a Principal Member of Technical Staff in the Reliability and Electrical Characterization group of the Advanced Reliability, Robustness and Test department of imec, Belgium. He received the B.Sc. (2005) and M.Sc. (2008) from the University of Calabria - Italy, and the Ph.D. degree from KU Leuven - Belgium (2013) in Electrical Engineering. His research focuses on CMOS FEOL reliability, and on gate stack development for novel device technologies (SiGe, Ge, III-V) and novel integration schemes (Sequential 3D).